napisy-gora

 

PRODUCTS

Dual Emission Electron Microscope product line includes three versions of this unique UHV instrument:

1π-DEEM.

"π" denotes the "PEEM" mode of operation and represents the lowest version of the DEEM serie. The flange-on instrument shown below can be easly upgraded to the "e" or "Σ" versions. 

 

peem bw poziomo1

 p4 tekst  peem poziomo

 

2. e-DEEM.

"e" denotes the "DEEM" mode of operation (i.e. spectroscopic function and simultaneous collecting of the energy selective real and reziprocal/ k-space images) and represents the spectroscopic version of the DEEM serie.The 10" flange-on instrument  shown below can be easly upgraded to the "Σ" version.

 

                                                p5 zdj

            



 

3. Σ-DEEM.

 

"Σ" denotes the "sum of all possible techniques", among others also the "auger DEEM" mode of operation and represents the spectroscopic version of the DEEM "e" serie (simultaneous collecting of the energy selective real and reziprocal/ k-space images) equipped with our novel sample electron illumination system.The highest version of the DEEM is shown below:

 

                           p6 zdj  

 

 

Concept of the novel high energy electron beam sample illumination in PEEM configuration

 

p6 e-gun1

  

 manuscript- click on the title below:

 

 

A flange on electron spectromicroscope

 

with spherical deflector analyzer—

simultaneous imaging of reciprocal and real spaces

 

 
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